Title :
Comparing Microchannel Technologies to Minimize the Thermal Stack and Improve Thermal Performance in Hybrid Electric Vehicles
Author :
Jankowski, Nicholas R. ; Everhart, Lauren ; Morgan, Brian ; Geil, Bruce ; McCluskey, Patrick
Author_Institution :
U.S. Army Res. Lab., Adelphi, MD
Abstract :
Hybrid electric vehicles for military applications require advanced cooling to ensure peak power electronics performance and reliability. Two methods of reducing overall thermal resistivity by integrating microchannel coolers into the power electronics thermal stack are explored. The first approach involves silicon manifold microchannel coolers with direct fluid impingement on the semiconductor die. The second involves fabricating standard, parallel microchannels into a standard aluminum nitride substrate. Both designs are evaluated for flow and thermal performance in cooling a 4 mm silicon carbide diode. Both designs are found to be of comparable performance, primarily due to non-optimum microchannel dimensions for operating pressures below 35 kPa. For both types of devices, typical flow rates ranged from 40-60 mL/min with thermal resistivities on the order of 0.13-0.19degC-m2/W. Potential for future improvement of each design is discussed.
Keywords :
electric vehicles; military vehicles; power electronics; advanced cooling; aluminum nitride substrate; direct fluid impingement; hybrid electric vehicles; microchannel coolers; microchannel technologies; military applications; peak power electronics performance; power electronics thermal stack; semiconductor die; silicon carbide diode; silicon manifold microchannel coolers; thermal performance; thermal resistivity; thermal stack; Aluminum nitride; Conductivity; Electronics cooling; Hybrid electric vehicles; Microchannel; Power electronics; Semiconductor diodes; Silicon carbide; Substrates; Thermal resistance;
Conference_Titel :
Vehicle Power and Propulsion Conference, 2007. VPPC 2007. IEEE
Conference_Location :
Arlington, TX
Print_ISBN :
978-0-7803-9760-6
Electronic_ISBN :
978-0-7803-9761-3
DOI :
10.1109/VPPC.2007.4544111