DocumentCode :
1881700
Title :
Using real-time chemical plume models in virtual training systems
Author :
Moses, Adam ; Obenschain, Keith ; Boris, Jay ; Patnaik, Gopal
Author_Institution :
Labs. for Comput. Phys. & Fluid Dynamics, US Naval Res. Lab., Washington, DC, USA
fYear :
2015
fDate :
14-16 April 2015
Firstpage :
1
Lastpage :
6
Abstract :
This paper describes the design, implementation, and use of integrated chemical plume-models in virtual training systems. The US Naval Research Laboratory has linked its CT-Analyst® software, a high-fidelity real-time plume modeling tool, with VBS2, a widely-used virtual gaming and training program, to produce new training capabilities that were previously unavailable. This work benefits two different but overlapping training scenarios: 1) tactical training for large-scale chemical gas attacks with a specific focus on crowd management, and 2) handler-focused training for users interested in working with IED-detecting dogs. The use of accurate, faster-than-real-time plume modeling enhances the virtual training systems to provide broader realistic support to the simulation and training communities.
Keywords :
computer based training; hazardous materials; military computing; serious games (computing); virtual reality; CT-Analyst software; IED-detecting dogs; US Naval Research Laboratory; VBS2; crowd management; handler-focused training; high-fidelity real-time plume modeling tool; integrated chemical plume-models; large-scale chemical gas attacks; real-time chemical plume models; serious gaming; tactical training; training capabilities; virtual gaming; virtual training program; virtual training systems; Avatars; Chemicals; Computational modeling; Geometry; Real-time systems; Training; Visualization; chemical agents; contaminants; dog handler; hazardous materials; improvised explosive device detection; plume modeling; serious gaming; simulation; virtual battle space; virtual training;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Technologies for Homeland Security (HST), 2015 IEEE International Symposium on
Conference_Location :
Waltham, MA
Print_ISBN :
978-1-4799-1736-5
Type :
conf
DOI :
10.1109/THS.2015.7225277
Filename :
7225277
Link To Document :
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