Title :
Robust Sine Wave Fitting in ADC Testing
Author :
Sárhegyi, Attila ; Kollár, István
Author_Institution :
Dept. of Meas. & Inf. Syst., Budapest Univ. of Technol. & Econ.
Abstract :
The IEEE standard 1241-2000 defines ADC testing methods which make use of least squares sine wave fitting algorithms. After sine fitting an error sequence is obtained and this is analyzed in order to determine the properties of the ADC. If the quantization noise dominates in this error sequence, the ADC error analysis may become somewhat misleading. This appears when the amplitude of the test signal is small enough or the amplitude is out of the range of the ADC. In this paper, a new method is proposed and analysed to remedy the above phenomena. Furthermore, the new algorithm is compared with dithering
Keywords :
circuit testing; curve fitting; error analysis; least squares approximations; quantisation (signal); ADC testing; IEEE standard 1241-2000; error analysis; error sequence; least squares method; quantization noise; sine wave fitting; test signals; Information systems; Instrumentation and measurement; Least squares methods; MATLAB; Mathematical model; Noise level; Nonlinear distortion; Quantization; Robustness; System testing; ADC test; ADC test program; IEEE standard 1241-2000; MATLAB; four-parameter method; least squares; sine wave fitting; three-parameter method;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
Conference_Location :
Sorrento
Print_ISBN :
0-7803-9359-7
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2006.328246
