Title :
Eleventh IEEE European Test Symposium
Abstract :
The following topics are dealt with: delay fault testing; single-event upsets; memory testing; reconfigurable systems testing; BIST; test data compression for logic; sigma-delta modulators; current-based testing; power switch testing; test of AD and DA circuits; automatic test pattern generation; advanced analog testing; test of asynchronous and NOC circuitry; and embedded tutorials
Keywords :
asynchronous circuits; automatic test pattern generation; built-in self test; fault simulation; logic testing; sigma-delta modulation; AD circuits; DA circuits; NOC circuits; advanced analog testing; asynchronous circuits; automatic test pattern generation; built-in self-testing; current-based testing; delay fault testing; memory testing; power switch testing; reconfigurable systems testing; sigma-delta modulators; single-event upsets; test data compression;
Conference_Titel :
Test Symposium, 2006. ETS '06. Eleventh IEEE European
Conference_Location :
Southampton
Print_ISBN :
0-7695-2566-0
DOI :
10.1109/ETS.2006.15
