DocumentCode :
1882213
Title :
Experimental optimisation of high power IGBT modules performances working at the edges of their safe operating area
Author :
Abbate, C. ; Busatto, G. ; Manzo, R. ; Fratelli, L. ; Cascone, B. ; Giannini, G. ; Iannuzzo, F.
Author_Institution :
Dept. of Autom., Electromagn., Information Eng. & Industrial Mathematics, Cassino Univ., Italy
Volume :
4
fYear :
2004
fDate :
2004
Firstpage :
2588
Abstract :
An experimental characterization of new 3300 V - 1200 A IGBT modules both at high temperature and for output currents beyond SOA, at turn-off and in short circuit conditions, is presented. Moreover a new driving strategy that improves, in comparison with conventional driving methods, IGBT turn-on on inductive load, in terms of power dissipation, is reported. Results demonstrate that, in principle, it is possible to operate at larger current than RBSOA limits and at temperature of 145 °C. As regard turn-on operation, up to 37% dissipated energy reduction can be obtained with the innovative on-gate control. All the experimental study has been performed by means of a non-destructive experimental set-up, where IGBT modules are switched in presence of a protection circuit that is able to prevent device failure at the occurrence of any possible unstable behaviour.
Keywords :
circuit testing; insulated gate bipolar transistors; nondestructive testing; optimisation; short-circuit currents; 1200 A; 145 degC; 3300 V; dissipated energy reduction; high power IGBT modules performance optimisation; on-gate control; power dissipation; safe operating area; short circuit conditions; Circuit testing; Insulated gate bipolar transistors; Nondestructive testing; Power system reliability; Protection; Switches; Switching circuits; Temperature; Thermal stresses; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics Specialists Conference, 2004. PESC 04. 2004 IEEE 35th Annual
ISSN :
0275-9306
Print_ISBN :
0-7803-8399-0
Type :
conf
DOI :
10.1109/PESC.2004.1355238
Filename :
1355238
Link To Document :
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