DocumentCode :
1882262
Title :
Living with Failure: Lessons from Nature?
Author :
Furber, Steve
Author_Institution :
University of Manchester, UK
fYear :
2006
fDate :
21-24 May 2006
Firstpage :
4
Lastpage :
8
Abstract :
The resources available on a chip continue to grow, following Moore´s Law. However, the major process by which the benefits of Moore´s Law accrue, which is the continuing reduction in feature size, is predicted to bring with it disadvantages in terms of device reliability and parameter variability. The problems that this will bring are underlined by the predictions from an Intel commentator: within a decade we will see 100 billion transistor chips. That is the good news. The bad news is that 20 billion of those transistors will fail in manufacture and a further 10 billion will fail in the first year of operation.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2006. ETS '06. Eleventh IEEE European
Conference_Location :
Southampton
Print_ISBN :
0-7695-2566-0
Type :
conf
DOI :
10.1109/ETS.2006.28
Filename :
1628146
Link To Document :
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