Minimal March Tests for Dynamic Faults in Random Access Memories

The class of dynamic faults has been recently shown to be an important class of faults for the new technologies of random access memories (RAM) with significant impact on DPM levels. Very little research has been done in the design of memory test algorithms targeting dynamic faults. Two March test algorithms of complexity 11N and 22N, N is the number of memory cells, for subclasses of two-operation single-cell and two-cell dynamic faults respectively were proposed earlier by other authors. Also a March test of complexity 100N was proposed by them for detection of two-cell dynamic faults with two fault-sensitizing operations both applied on the victim or aggressor cells. In this paper, for the first time, minimal March test algorithms are proposed for two-operation single-cell and two-cell dynamic faults. The previously known March test algorithm for detection of two-operation two-cell dynamic faults is improved by 30N