A 22n March Test for Realistic Static Linked Faults in SRAMs

Author

Benso, A. ; Bosio, A. ; Di Carlo, S. ; Di Natale, G. ; Prinetto, P.

Author_Institution

Dipt. di Automatica e Informatica, Politecnico di Torino

fYear

2006

fDate

21-24 May 2006

Firstpage

49

Lastpage

54

Abstract

Linked faults are considered an interesting class of memory faults. Their capability of influencing the behavior of other faults causes the hiding of the fault effect and makes test algorithm design a very complex task. Although several March tests have been developed for the wide memory faults spread, a few of them are able to detect linked faults. In the present paper March AB, a March test targeting the set of realistic memory linked fault is presented. Comparison results show that the proposed March test provides the same fault coverage of already published algorithms but, it reduces the test complexity and therefore the test time. Moreover, a complete taxonomy of linked faults will be presented

Keywords

SRAM chips; fault simulation; integrated circuit testing; logic testing; 22n March test; March AB; SRAM; fault coverage; fault effect; memory faults; realistic static linked faults; test algorithm; Access protocols; Algorithm design and analysis; Digital systems; Fault detection; Hardware; Random access memory; Semiconductor memory; System-on-a-chip; Taxonomy; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 2006. ETS '06. Eleventh IEEE European

Conference_Location

Southampton

Print_ISBN

0-7695-2566-0

Type

conf

DOI

10.1109/ETS.2006.2

Filename

1628153