Title :
A 22n March Test for Realistic Static Linked Faults in SRAMs
Author :
Benso, A. ; Bosio, A. ; Di Carlo, S. ; Di Natale, G. ; Prinetto, P.
Author_Institution :
Dipt. di Automatica e Informatica, Politecnico di Torino
Abstract :
Linked faults are considered an interesting class of memory faults. Their capability of influencing the behavior of other faults causes the hiding of the fault effect and makes test algorithm design a very complex task. Although several March tests have been developed for the wide memory faults spread, a few of them are able to detect linked faults. In the present paper March AB, a March test targeting the set of realistic memory linked fault is presented. Comparison results show that the proposed March test provides the same fault coverage of already published algorithms but, it reduces the test complexity and therefore the test time. Moreover, a complete taxonomy of linked faults will be presented
Keywords :
SRAM chips; fault simulation; integrated circuit testing; logic testing; 22n March test; March AB; SRAM; fault coverage; fault effect; memory faults; realistic static linked faults; test algorithm; Access protocols; Algorithm design and analysis; Digital systems; Fault detection; Hardware; Random access memory; Semiconductor memory; System-on-a-chip; Taxonomy; Testing;
Conference_Titel :
Test Symposium, 2006. ETS '06. Eleventh IEEE European
Conference_Location :
Southampton
Print_ISBN :
0-7695-2566-0