DocumentCode :
1882492
Title :
Characteristics and transport properties of polyaniline free standing films prepared by controlled processing
Author :
Jeong, Soon Kwan ; Suh, J.S. ; Oh, E.J. ; Park, Y.W. ; Kim, C.Y. ; MacDiarmid, A.G.
Author_Institution :
The Ohio State University
fYear :
1994
fDate :
24-29 July 1994
Firstpage :
81
Lastpage :
81
Abstract :
Summary form only given. A low frequency Drude model was used to analyze the large negative dielectric constants at microwave frequency (/spl epsi//sub mw/ > -5x10/sup 4/) for the center portion of I/sub/2 doped stretched Tsukamoto polyacetylene (T-(CH)/sub x/) and unoriented polypyrrole (PPY) containing PF-/sub 6/. The relatively small plasma frequencies (w/sub p/ /spl sim-/ 0.025 eV and 0.011 eV, respectively) and anomalously long scattering times (/spl tau//spl sim-/3.3x10/sup -11/ s and 1.6x10/sup -11/ s, respectively) of these materials indicates the importance of phonon back scattering of the most delocalized conduction electrons as expected for the open Fermi surface of an highly anisotropic metal. Our conclusions for w/sub p/ of doped polyacetylene agree with w/sub p/ obtained from the earlier optical measurements./sup 1/ These results are contrasted with the more localized behavior of the neck and end portions of stretched T-(CH)/sub x/ and of PPY doped with TsO/sup -/. Aging effects for stretched T-(CH)/sub x/ is also reported, together with confirination /sup 2/ of high Pauli susceptibility for the most metallic heavily doped polyacetylene. *Supported in part by NEDO (New Energy and Industrial Technology Development Org). We gratefully acknowledge discussions with V. N. Prigodin.
Keywords :
Chemical technology; Chemistry; Conductive films; Conductivity; Frequency; Metals industry; Optical scattering; Physics; Process control; Solvents;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Science and Technology of Synthetic Metals, 1994. ICSM '94. International Conference on
Conference_Location :
Seoul, Korea
Type :
conf
DOI :
10.1109/STSM.1994.834776
Filename :
834776
Link To Document :
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