• DocumentCode
    1882512
  • Title

    The metallic state of doped polyacetylene and polypyrrole

  • Author

    Joo, Jin-Hong ; Wang, Yannan ; Du, Gang ; Epstein, A.J. ; Kaneko, Hironori ; Ishiguro, Tsukasa ; Tsukamoto, Jun

  • Author_Institution
    The Ohio State University
  • fYear
    1994
  • fDate
    24-29 July 1994
  • Firstpage
    81
  • Lastpage
    81
  • Abstract
    Summary form only given. A low frequency Drude model was used to analyze the large negative dielectric constants at microwave frequency (/sp epsi//sub mw/ > -5x10/sup 4/) for the center portion of I/sub 2/ doped stretched Tsukamoto polyacetylene (T-(CH)/sub x/) and unoriented polypyrrole (PPY) containing PF/sup -//sub6/. The relatively small plasma frequencies (w/sub p/ /spl sim/- 0.025 eV and 0.011 eV, respectively) and anomalously long scattering times (/spl tau/ /spl sim/- 3.3x10/sup -11/ s and 1.6x10/sup -11/ s, respectively) of these materials indicates the importance of phonon back scattering of the most delocalized conduction electrons as expected for the open Fermi surface of an highly anisotropic metal. Our conclusions for w/sub p/ of doped polyacetylene agree with w/sub p/ obtained from the earlier optical measurements./sup 1/ These results are contrasted with the more localized behavior of the neck and end portions of stretched T-(CH)/sub x/ and of PPY doped with TsO/sup -/. Aging effects for stretched T-(CH)/sub x/ is also reported, together with confirmation/sup 2/ of high Pauli susceptibility for the most metallic heavily doped polyacetylene. * Supported in part by NEDO (New Energy and Industrial Technology Development Org). We gratefully acknowledge discussions with V. N. Prigodin.
  • Keywords
    Conducting materials; Dielectric constant; Laboratories; Microwave frequencies; Optical scattering; Physics; Plasma applications; Plasma materials processing; Plastics industry; Polymers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Science and Technology of Synthetic Metals, 1994. ICSM '94. International Conference on
  • Conference_Location
    Seoul, Korea
  • Type

    conf

  • DOI
    10.1109/STSM.1994.834777
  • Filename
    834777