Title :
Algorithm to Remove Spectral Leakage, Close-in Noise, and Its Application to Converter Test
Author_Institution :
Teradyne, Inc., Boston, MA
Abstract :
A fundamental condition of using discrete Fourier is that the signal being transformed needs to be periodic and transform is performed on an integer number of these periods. In practice, due to some physical limitations, this condition is not always satisfied. A phenomenon known as leakage occurs and cause serious distortion in the transformed signal. Window functions are generally used at the expense of a reduced spectral resolution. Other alternative methods have also been proposed, but none of them offers the quality of direct Fourier transform of a periodic signal. This paper presents a new algorithm, called FXT, which produces equivalent spectral result with non-periodic signal as if the signal was periodic
Keywords :
discrete Fourier transforms; spectral analysis; close-in noise removal; converter test; discrete Fourier transform; nonperiodic signals; production test; reduced spectral resolution; spectral leakage removal; transformed signals; window functions; Discrete Fourier transforms; Fourier transforms; Jitter; Noise generators; Oscillators; Phase noise; Production; Sampling methods; Signal resolution; Testing; ADC; DAC; Fourier Transform; close-in phase noise; crystal oscillator; jitter; non-coherent sampling; power estimation; production test; spectral leakage; window function;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
Conference_Location :
Sorrento
Print_ISBN :
0-7803-9359-7
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2006.328340