Title :
A Transparent based Programmable Memory BIST
Author :
Boutobza, Slimane ; Nicolaidis, Michael ; Lamara, Kheiredine M. ; Costa, Andrea
Author_Institution :
Synopsys Inc., Montbonnot
Abstract :
We present an original transparent-based programmable memory BIST solution suitable for offline as well as online memory testing. Thanks to an appropriate combination of the test algorithm with the data backgrounds and by providing unlimited background flexibility, the proposed solution allows covering almost all existing fault models while increases the probability to also detect un-modeled faults
Keywords :
built-in self test; fault simulation; integrated circuit testing; integrated memory circuits; logic testing; programmable circuits; built-in self-test; data backgrounds; fault models; online memory testing; programmable memory BIST; unmodeled fault detection; Algorithm design and analysis; Built-in self-test; Circuit faults; Circuit testing; Costs; Fabrication; Fault detection; Process design; Random access memory; Read-write memory;
Conference_Titel :
Test Symposium, 2006. ETS '06. Eleventh IEEE European
Conference_Location :
Southampton
Print_ISBN :
0-7695-2566-0
