DocumentCode :
1882692
Title :
Convolutional Compactors with Variable Polynomials
Author :
Pogiel, Artur ; Rajski, Janusz ; Tyszer, Jerzy
Author_Institution :
Poznan Univ. of Technol.
fYear :
2006
fDate :
21-24 May 2006
Firstpage :
117
Lastpage :
122
Abstract :
This paper introduces a new test response compaction scheme that rests on convolutional compactors. The resultant compression, however, is not limited by the ratio of scan chains to compactor outputs. This enhanced convolutional compactor, similarly to its origin, is capable of handling unknown states and detecting multiple errors. The experimental results demonstrate efficiency of the proposed scheme
Keywords :
automatic test equipment; boundary scan testing; logic testing; polynomials; convolutional compactors; multiple error detection; scan chains; test response compaction scheme; variable polynomials; Built-in self-test; Compaction; Convolution; Graphics; Logic; Moore´s Law; Polynomials; Registers; Test data compression; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2006. ETS '06. Eleventh IEEE European
Conference_Location :
Southampton
Print_ISBN :
0-7695-2566-0
Type :
conf
DOI :
10.1109/ETS.2006.11
Filename :
1628163
Link To Document :
بازگشت