• DocumentCode
    1882943
  • Title

    Study of the Normal Generalized Stochastic Petri nets and its Application in Testing System

  • Author

    Zhan, Huiqin ; Gu, Jun

  • Author_Institution
    Dept. of Autom., Univ. of Electron. Sci. & Technol., Chengdu
  • fYear
    2006
  • fDate
    24-27 April 2006
  • Firstpage
    1123
  • Lastpage
    1128
  • Abstract
    Study methodologies for application of Petri nets theory to the modeling and performance analysis of testing system. Current stochastic Petri nets theories under active research generally assume that the transition associated with random time coincides with negative exponential distribution. But testing system and its hardware circuits modeled after stochastic Petri nets do not match the assumption of negative exponential distribution, rather coincide with other distribution. Based on the fact, this paper proposed the definition and analysis methodologies of the normal generalized stochastic Petri net (NGSPN) in order to solve the Petri net state space explosion of complex system, the authors adopted a different approach to study reduction techniques of the basic Petri net components serial and parallel connection models, deduced the equivalent theorems of reducing the NGSPNs serial connection model proposed some approximate formulas for reducing the parallel connection model under several common scenarios through simulation. A concrete example is given for NGSPN modeling and serial and parallel connection reduction of a testing systems data acquisition card
  • Keywords
    Petri nets; data acquisition; stochastic processes; test equipment; Petri net state space explosion; data acquisition card; hardware circuits; negative exponential distribution; normal generalized stochastic Petri nets; parallel connection; performance analysis; serial connection; testing system modeling; Circuit testing; Explosions; Exponential distribution; Hardware; Performance analysis; Petri nets; State-space methods; Stochastic processes; Stochastic systems; System testing; Model Reduction; Normal Generalized Stochastic Petri net (NGSPN); Serial/Parallel Connection; Testing System Modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
  • Conference_Location
    Sorrento
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-9359-7
  • Electronic_ISBN
    1091-5281
  • Type

    conf

  • DOI
    10.1109/IMTC.2006.328384
  • Filename
    4124513