A Low Cost Alternative Method for Harmonics Estimation in a BIST Context

Author

Fresnaud, V. ; Bossuet, L. ; Dallet, D. ; Bernard, S. ; Janik, J.M. ; Agnus, B. ; Cauvet, Ph. ; Gandy, Ph.

Author_Institution

Philips France Semiconducteurs, Caen

fYear

2006

fDate

21-24 May 2006

Firstpage

193

Lastpage

198

Abstract

Spectral analysis represents a key component in signal processing. The on-chip implementation of classical spectral estimation techniques is generally not considered as a viable BIST solution because of the huge amount of required additional circuitry (multipliers, complex operators). This paper describes a new method for spectral parameter estimation allowing the extraction of the first harmonic with only very simple operators. This method is based on Fourier series expansion and a piecewise algorithm. The results are validated using simulations and experiments, and the method showed relevant results to an embedded solution

Keywords

Fourier analysis; Fourier series; built-in self test; integrated circuit testing; spectral analysis; Fourier series expansion; built-in self-test; harmonics estimation; on-chip spectral estimation; piecewise algorithm; signal processing; spectral analysis; spectral parameter estimation; Built-in self-test; Circuit testing; Costs; Fourier series; Frequency estimation; Power harmonic filters; Production; Signal processing; Signal processing algorithms; Spectral analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 2006. ETS '06. Eleventh IEEE European

Conference_Location

Southampton

Print_ISBN

0-7695-2566-0

Type

conf

DOI

10.1109/ETS.2006.5

Filename

1628174