Title :
Low-Cost Online Testing of Asynchronous Handshakes
Author :
Shang, D. ; Yakovlev, A. ; Burns, F. ; Xia, F. ; Bystrov, A.
Author_Institution :
Sch. of Electr. Eng. & Comput. Eng., Newcastle upon Tyne Univ.
Abstract :
A new low-cost low-complexity checker for online testing of asynchronous interfaces in globally-asynchronous locally-synchronous circuits is proposed. The solution is fully based upon the standard gate libraries. The checker itself is fully offline testable. It also provides a fault-locating functionality, which is achieved by combining the online mode with scan techniques
Keywords :
asynchronous circuits; boundary scan testing; fault simulation; integrated circuit testing; asynchronous handshakes; asynchronous interfaces; checker; fault-location; globally-asynchronous locally-synchronous circuits; online testing; scan techniques; standard gate libraries; Asynchronous circuits; Built-in self-test; Circuit faults; Circuit testing; Clocks; Protocols; Switches; Synchronization; System testing; Transistors;
Conference_Titel :
Test Symposium, 2006. ETS '06. Eleventh IEEE European
Conference_Location :
Southampton
Print_ISBN :
0-7695-2566-0
DOI :
10.1109/ETS.2006.31
