DocumentCode
1883181
Title
Soft-Error Rate Testing of Deep-Submicron Integrated Circuits
Author
Heijmen, Tino ; Nieuwland, André
Author_Institution
Philips Res. Labs., Eindhoven
fYear
2006
fDate
21-24 May 2006
Firstpage
247
Lastpage
252
Abstract
Soft errors induced by radiation pose a major challenge for the reliability of complex chips processed in state-of-the-art technologies. This paper reviews soft-error rate (SER) characterization by realtime system-SER testing and by accelerated testing. Additionally, we present scaling trends, simulation approaches, and improvement techniques. Special attention is given to soft errors in combinational logic
Keywords
combinational circuits; integrated circuit testing; life testing; logic testing; radiation effects; reliability; combinational logic; deep-submicron integrated circuits; integrated circuit testing; soft-error rate testing; Alpha particles; CMOS technology; Circuit testing; Cosmic rays; Impurities; Integrated circuit testing; Logic devices; Packaging; Silicon; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2006. ETS '06. Eleventh IEEE European
Conference_Location
Southampton
Print_ISBN
0-7695-2566-0
Type
conf
DOI
10.1109/ETS.2006.42
Filename
1628182
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