Title :
Soft-Error Rate Testing of Deep-Submicron Integrated Circuits
Author :
Heijmen, Tino ; Nieuwland, André
Author_Institution :
Philips Res. Labs., Eindhoven
Abstract :
Soft errors induced by radiation pose a major challenge for the reliability of complex chips processed in state-of-the-art technologies. This paper reviews soft-error rate (SER) characterization by realtime system-SER testing and by accelerated testing. Additionally, we present scaling trends, simulation approaches, and improvement techniques. Special attention is given to soft errors in combinational logic
Keywords :
combinational circuits; integrated circuit testing; life testing; logic testing; radiation effects; reliability; combinational logic; deep-submicron integrated circuits; integrated circuit testing; soft-error rate testing; Alpha particles; CMOS technology; Circuit testing; Cosmic rays; Impurities; Integrated circuit testing; Logic devices; Packaging; Silicon; System testing;
Conference_Titel :
Test Symposium, 2006. ETS '06. Eleventh IEEE European
Conference_Location :
Southampton
Print_ISBN :
0-7695-2566-0
DOI :
10.1109/ETS.2006.42
