• DocumentCode
    1883194
  • Title

    Acceptable bubble size in potting materials

  • Author

    Weil, Thomas

  • Author_Institution
    Raytheon Co., Wayland, MA, USA
  • fYear
    1990
  • fDate
    11-16 March 1990
  • Firstpage
    444
  • Lastpage
    447
  • Abstract
    Air gaps or bubbles within the solid insulation used in high-voltage power supplies are discussed. These bubbles can be a cause of failure if the AC voltage across the gap or bubble is sufficient to cause ionization (corona). If the bubbles are small enough, they will not be a problem because there will not be enough voltage across the gas to cause ionization to start. The purpose of this work is to show how small is small enough. The results should apply equally well to naturally occurring bubbles in other kinds of insulation such as paper, Teflon, Kapton, and other plastics. The problem was approached by running an electrostatic field stress program for bubbles occurring in potting (encapsulation) materials, with various values of dielectric constant. A typical case is shown. Cases were run not only for bubbles but also for transverse cylinders. It was found that the voltage stress factor for bubbles and cylinders is surprisingly low, and it stays low even for large values of relative dielectric constant. It is concluded that since the maximum voltage stress in the potting material does not exceed 200 V/mil. even locally, bubbles up to 0.75 mm should be acceptable.<>
  • Keywords
    corona; insulation testing; power supplies to apparatus; 0.75 mm; AC voltage; Kapton; Teflon; acceptable bubble size; air gaps; bubbles; corona; electrostatic field stress program; encapsulation materials; failure; high-voltage power supplies; ionization; paper; plastics; potting materials; relative dielectric constant; solid insulation; transverse cylinders; voltage stress factor; Air gaps; Corona; Dielectric constant; Dielectric materials; Insulation; Ionization; Power supplies; Solids; Stress; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition, 1990. APEC '90, Conference Proceedings 1990., Fifth Annual
  • Conference_Location
    Los Angeles, CA, USA
  • Type

    conf

  • DOI
    10.1109/APEC.1990.66447
  • Filename
    66447