Title :
Intelligent computer based training
Author :
Ben-Bassat, Moshe ; Beniaminy, Israel ; Joseph, David
Author_Institution :
IET Intelligent Electron., Anaheim, CA, USA
Abstract :
Increasingly complex test equipment, complex technologies, growing pressure on technicians´ and engineers´ performance, and the need for integrated knowledge during the problem-resolution process, are all demanding a higher level of expertise and a new approach to training
Keywords :
automatic test software; computer based training; diagnostic expert systems; fault diagnosis; intelligent tutoring systems; complex test equipment; expert system training; fault isolation; integrated knowledge; intelligent computer based training; problem-resolution process; Diagnostic expert systems; Electronic equipment testing; Fault diagnosis; Isolation technology; Knowledge engineering; Logic; Pressing; System testing; Test equipment; Timing;
Conference_Titel :
AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-4162-7
DOI :
10.1109/AUTEST.1997.633568
