• DocumentCode
    1883616
  • Title

    Average delay analysis of opportunistic single copy delivery in Manhattan area using biased random walk

  • Author

    Jun, Jung Hyun ; Fu, Weihuang ; Agrawal, Dharma P.

  • Author_Institution
    Sch. of Comput. Sci. & Inf., Univ. of Cincinnati, Cincinnati, OH, USA
  • fYear
    2011
  • fDate
    10-15 April 2011
  • Firstpage
    566
  • Lastpage
    571
  • Abstract
    In Mobile Opportunistic Networks, the cost and effectiveness of any opportunistic forwarding is measured by the expected delay of a message. Hence, its critical goal is to have low delay for a message. This paper studies the average delay of a message in a Mobile Opportunistic Network on Manhattan area. We first model the mobility of a message as a biased random walk in tilted grid and analyze the delay of a message based on the hitting time of a bias random walk. We have derived an exact expression of expected delay for a walk starting from any point in tilted grid for both biased and unbiased random walks and provide a closed form approximation of average delay of a message for the case of unbiased random walk. The key result is that the average delay of a message in Mobile Opportunistic Networks is very sensitive to the biased level of a random walk at each stage of the walk (depends on the distance from destination at its current stage). Then, this key result explains why most of the smart message forwarding algorithm in Mobile Opportunistic Network works reasonably well.
  • Keywords
    delays; mobile radio; mobility management (mobile radio); random processes; average delay analysis; hitting time; mobile opportunistic networks; opportunistic forwarding; opportunistic single copy delivery; smart message forwarding; unbiased random walks; Approximation methods; Delay; Markov processes; Mobile communication; Mobile computing; Nickel; Wireless sensor networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Communications Workshops (INFOCOM WKSHPS), 2011 IEEE Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4577-0249-5
  • Electronic_ISBN
    978-1-4577-0248-8
  • Type

    conf

  • DOI
    10.1109/INFCOMW.2011.5928877
  • Filename
    5928877