• DocumentCode
    1883674
  • Title

    A model to predict the degradation of silicon dioxide films in mos structures

  • Author

    Samanta, Piyas ; Sarkar, C.K.

  • fYear
    2005
  • fDate
    March 15-17, 2005
  • Firstpage
    11
  • Lastpage
    16
  • Keywords
    Degradation; Dielectric breakdown; Electron traps; Impact ionization; Predictive models; Semiconductor films; Silicon compounds; Thermal stresses; Tunneling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Science Conference, 2005. NRSC 2005. Proceedings of the Twenty-Second National
  • Print_ISBN
    977-503183-4
  • Type

    conf

  • DOI
    10.1109/NRSC.2005.193981
  • Filename
    1502108
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1883674