• DocumentCode
    1883769
  • Title

    Some aspects of novel micro-contacts in Microwave Chip Carriers

  • Author

    Arnaudov, Radosvet ; Videkov, Valentin ; Avdgiiski, Bojidar ; Andreev, Svetozar ; Philippov, Philip

  • Author_Institution
    Dept. of Microelectron., Tech. Univ. Sofia, Sofia, Bulgaria
  • fYear
    2010
  • fDate
    22-24 Sept. 2010
  • Firstpage
    49
  • Lastpage
    55
  • Abstract
    Design and development of novel type micro-contacts in Microwave Chip Carriers to Printed Circuit Board (PCB) assembly are presented in this paper. A new concept of micro-contacts for packaging solutions of microwave and mm-wave MMICs is depicted. Simulation and Vector Network Analyzer (VNA) measurement results for these micro-contact transitions are discussed. The results show that electrical parameters are highly dependent on the transition dimensions and substrate features. These contacts are based on male stud (bump) and female (ring) approach. When mating each other, clips effect and self-alignment features appear. Special attention is paid to the shape of the micro-contacts in order to facilitate assembly and strengthen the connection. Equivalent electrical circuit is proposed for SPICE simulation of the DC contact resistance. Finally, the article discusses technological development of the proposed new micro-contact stud/ring pair by means of low cost Ultra-violet electroplating, lithography and molding (UV-LIGA) process.
  • Keywords
    electrical contacts; microwave integrated circuits; DC contact resistance; MMIC; SPICE simulation; electrical parameters; equivalent electrical circuit; microcontact transitions; microcontacts; microwave chip carriers; printed circuit board assembly; vector network analyzer; Helium; Microwave measurements; Packaging; Reliability; Sockets; TV; Transmission line measurements; MCMs; Micro-contacts; UV-LIGA; clips mating; microwave chip carriers; ring; solderless assembly; stud;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Actual Problems of Electronic Instrument Engineering (APEIE), 2010 10th International Scientific-Technical Conference on
  • Conference_Location
    Novosibirsk
  • Print_ISBN
    978-1-4244-8209-2
  • Electronic_ISBN
    978-1-4244-8210-8
  • Type

    conf

  • DOI
    10.1109/APEIE.2010.5677342
  • Filename
    5677342