DocumentCode :
1884036
Title :
An improved random walk approach for yield optimization
Author :
Yang, Q.S.
fYear :
1993
fDate :
3-6 May 1993
Firstpage :
2145
Lastpage :
2147
Keywords :
Algorithm design and analysis; Convergence; Laboratories; MMICs; Millimeter wave circuits; Millimeter wave technology; Monte Carlo methods; Optimization methods; Robustness; Yield estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
IEEE
Print_ISBN :
0-7803-1281-3
Type :
conf
Filename :
693107
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1884036
