Title :
Efficient image generation for EO system simulation
Author :
Webb, D.L. ; Elliott, D.F. ; Hung, L.L.
Author_Institution :
Rockwell Int. Corp., Anaheim, CA, USA
fDate :
31 Oct-2 Nov 1994
Abstract :
Efficient image generation techniques for electro-optical (EO) system simulation are presented. The techniques reduce computation time by orders of magnitude so Monte Carlo simulations become practical. Ray tracing to project signals onto a focal plane and convolution to blur projected images are time consuming so methods that minimize this time are most important. Methods for efficient simulation of detector characteristics, including noise, are also described
Keywords :
Monte Carlo methods; convolution; electro-optical devices; image processing; ray tracing; sensors; simulation; EO system simulation; Monte Carlo simulations; convolution; detector characteristics; electro-optical sensors; electro-optical system simulation; focal plane; image generation; noise; projected images; ray tracing; Background noise; Computational modeling; Convolution; Detectors; Electrooptic devices; Equations; Image generation; Optical noise; Ray tracing; Sensor phenomena and characterization;
Conference_Titel :
Signals, Systems and Computers, 1994. 1994 Conference Record of the Twenty-Eighth Asilomar Conference on
Conference_Location :
Pacific Grove, CA
Print_ISBN :
0-8186-6405-3
DOI :
10.1109/ACSSC.1994.471511
