DocumentCode
1884779
Title
Experiments on a novel vapor chamber
Author
Wong, Shwin-Chung ; Wu, Jia-Da ; Han, Wei-Lun
Author_Institution
Dept. of Power Mech. Eng., Nat. Tsing Hua Univ., Hsinchu
fYear
2008
fDate
28-31 May 2008
Firstpage
75
Lastpage
78
Abstract
A novel vapor chamber is proposed and tested in this study. Multi-layer copper mesh is sintered to the inner surface of the bottom plate as the evaporator wick. Parallel channels, with inter-channel openings, are made on the inner surface of the top plate. The peaks of the channel walls directly contact with the wick so that the channels function as vapor path, condenser and structural supporters simultaneously. The corrugated channel walls provide not only an enlarged condensation area, but also a shortcut for a portion of the liquid condensed on the channel surface to be directly absorbed back to the wick. The rest of the condensed water will be driven by the vapor flow along the channel to both ends and enter the wick. These liquid flow paths yield smaller flow resistance, instead of passing through a long distance in porous wick as in the conventional design. The anti-dry-out capability leads to larger maximum heat dissipating capacity. More important, the simple structure can lead to easy manufacturing and low cost. The test module includes a copper plate-fin heat sink in combination with a top fan. With temperatures are measured at various locations on the heat sink base and the heater surface, the thermal resistances of the vapor chamber are determined against heat loads. With a 2 cm times 2 cm heating area, the vapor chamber resistance decreases from 0.08 to 0.03 when the heat load increasing from 80 W to 460 W, without reaching dry-out limit.
Keywords
heat sinks; microprocessor chips; thermal resistance; CPU; anti-dry-out capability; copper plate-fin heat sink; corrugated channel walls; evaporator wick; heat dissipating capacity; multilayer copper mesh; parallel channels; power 80 W to 460 W; thermal resistances; vapor chamber; Copper; Corrugated surfaces; Costs; Fluid flow; Heat sinks; Manufacturing; Resistance heating; Surface resistance; Temperature measurement; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems, 2008. ITHERM 2008. 11th Intersociety Conference on
Conference_Location
Orlando, FL
ISSN
1087-9870
Print_ISBN
978-1-4244-1700-1
Electronic_ISBN
1087-9870
Type
conf
DOI
10.1109/ITHERM.2008.4544256
Filename
4544256
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