• DocumentCode
    1884861
  • Title

    Development of a complete transient microchannel heat sink model

  • Author

    Farnam, Dylan ; Sammakia, Bahgat ; Ghose, Kanad

  • Author_Institution
    Mech. Eng. Dept., State Univ. of New York at Binghamton, Binghamton, NY
  • fYear
    2008
  • fDate
    28-31 May 2008
  • Firstpage
    113
  • Lastpage
    120
  • Abstract
    microchannel heat sinks are considered a strong candidate for meeting the increasing cooling needs of high-power microprocessors of today and the significant future. Such heat sinks are capable of dissipating impressive amounts of energy, as a result of high attainable heat transfer and favorable heat transfer surface area to volume ratios. The majority of microchannel heat sink studies performed to date have dealt with the steady state analysis of constant power density devices. On the contrary, power densities of microprocessors vary with both location and time. This variation of power leads to reliability-threatening thermomechanical stresses in the device. Thus, dimensional and transient power fluctuations are important considerations in the study of potential cooling solutions. The thermal response of a microchannel heat sink cooling a device with power generation varying both dimensionally and with time is studied herein. A full 3-dimensional numerical model is developed and validated in order to analyze the thermal behavior of an entire microprocessor and the microchannel heat sink employed. The effects of implementation of two-way fluid flow, wherein neighboring channels in the sink have opposite fluid flow directions is also investigated.
  • Keywords
    heat sinks; heat transfer; microchannel flow; numerical analysis; 3D numerical model; constant power density devices; heat transfer surface area; high-power microprocessors; power generation; steady state analysis; thermomechanical stresses; transient microchannel heat sink model; two-way fluid flow; Cooling; Fluid flow; Heat sinks; Heat transfer; Microchannel; Microprocessors; Performance analysis; Steady-state; Thermal stresses; Thermomechanical processes; hot spot; numerical; power map; smart sink; temperature gradient; unsteady;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems, 2008. ITHERM 2008. 11th Intersociety Conference on
  • Conference_Location
    Orlando, FL
  • ISSN
    1087-9870
  • Print_ISBN
    978-1-4244-1700-1
  • Electronic_ISBN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2008.4544261
  • Filename
    4544261