Title :
The Interaction Between Metrological Parameters and Industrial Process Simulation Requirements for Equipment Scale-Up/Down by means of Dimensional Analysis
Author :
Batzias, Fragiskos A.
Author_Institution :
Dept. of Ind. Manage. & Technol., Piraeus Univ.
Abstract :
Industrial process scale up from laboratory to large scale by means of similarity theory and relevant techniques implies usually deviation of metrological parameter values, as a result of conditions changing. The present work deals with the design/development of an algorithmic procedure based on the interaction between metrological parameters and industrial process simulation for improving scale up by means of dimensional analysis when: (i) co-exists an engineering model; and (ii) no model has been reported so far in technical literature or practice. Implementation for both cases has been included
Keywords :
algebra; manufacturing processes; semiconductor process modelling; dimensional analysis; engineering model; industrial process simulation; interval algebra; metrological parameters; Algorithm design and analysis; Analytical models; Computational modeling; Computer aided engineering; Computer simulation; Design automation; Laboratories; Large-scale systems; Merging; Metrology; dimensional analysis; interval algebra; metrology; scale-up/down; similarity;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
Conference_Location :
Sorrento
Print_ISBN :
0-7803-9359-7
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2006.328645
