• DocumentCode
    1885283
  • Title

    A new draft specification for surface mounting components

  • Author

    Lynch, J.T.

  • Author_Institution
    Plessey Res. & Technol., Towcester, UK
  • fYear
    1990
  • fDate
    20-23 May 1990
  • Firstpage
    264
  • Abstract
    A specification which develops tests to assess the ability of an SMD (surface-mount device), regardless of shape, size, or component family, to withstand the various surface-mount assembly processes is described. The specification identifies these process steps and assesses the stresses which they place upon the SMD. For each type of solder process, a detailed consideration is made of the time/temperature profile. This allows the derivation of severity classifications and the formulation of test methods for solderability, resistance to solder heat, and resistance to dissolution of metallization which are applicable to one or more of the solder attachment techniques. The specification considers substrate cleaning and develops test methods to assess the ability of the SMD to withstand the various cleaning techniques available. Attention is also given to resistance to mechanical forces, including the ability of the SMD to withstand pick and placement forces, substrate bending, and shear test
  • Keywords
    electron device testing; printed circuit manufacture; surface mount technology; draft specification; pick and placement forces; resistance to dissolution of metallization; resistance to mechanical forces; resistance to solder heat; severity classifications; shear test; substrate bending; substrate cleaning; surface mounting components; surface-mount assembly processes; test methods; test methods for solderability; time/temperature profile; Assembly; Cleaning; Electronic components; Electronic equipment testing; Hybrid integrated circuits; Life testing; Performance evaluation; Standards; Surface-mount technology; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1990. ., 40th
  • Conference_Location
    Las Vegas, NV
  • Type

    conf

  • DOI
    10.1109/ECTC.1990.122200
  • Filename
    122200