Title :
Free-volume entities in thick-film nanostructures studied with PAL spectroscopy
Author :
Klym, H.I. ; Ingram, A. ; Hadzaman, I.V. ; Shpotyuk, O.I.
Author_Institution :
Lviv Polytech. Nat. Univ., Lviv, Ukraine
Abstract :
Free-volume entities in so-called “free” thick-film structures based on spinel-type Cu0.1Ni0.8Co0.2Mn1.9O4 ceramics are studied for the first time using positron annihilation lifetime spectroscopy. It is shown that two-state positron trapping model is appropriate for an adequate description of changes caused by additional glass phase in these materials. The observed behaviour of defect-related component in the fit of the experimentally measured positron lifetime spectra for thick films in comparison with bulk ceramics testifies in a favour of agglomeration of free volume entities during technological process.
Keywords :
cobalt compounds; copper compounds; glass ceramics; nanostructured materials; nickel compounds; positron annihilation; thin films; Cu0.1Ni0.8Co0.2Mn1.9O4; PAL spectroscopy; agglomeration; defect-related component; free thick-film structures; free-volume entities; glass phase; positron annihilation lifetime spectroscopy; spinel-type ceramics; thick-film nanostructures; two-state positron trapping model; Ceramics; Charge carrier processes; Glass; Grain boundaries; Positrons; Thick films;
Conference_Titel :
Laser and Fiber-Optical Networks Modeling (LFNM), 2013 12th International Conference on
Conference_Location :
Sudak
Print_ISBN :
978-1-4799-0158-6
DOI :
10.1109/LFNM.2013.6644841
