Title :
Uncertainty Evaluation of a THD Meter based on FPGA platform
Author :
De Capua, Claudio ; Romeo, Emilia ; Zoccali, Giovanni
Author_Institution :
Dept. of Comput. Sci. & Electr. Technol., Reggio Calabria Univ.
Abstract :
In this paper we propose an instrument for the power quality monitoring, through the measure of PQ indexes (in particular we refer in this work to the THD index meter) and its characterization. The realized instrument is able to acquire the signal samples (opportunely conditioned) from the power network, to calculate the THD index and to estimate the uncertainty by which the last result is affected. The implementation makes use of a FPGA (field programmable gate array) Xilinx Virtex-II programmed in VHDL. This electronic device is a valid solution to speed, dissipated power and costs problems, and may be revisited every time the algorithm it implements becomes too obsolete (e.g. when new PQ indexes need to be substituted for old ones) or when one wants (for different needs) vary even one parameter of the structure. The utilized development system traduces the code (VHDL is a universal and highly compatible programming language) into the circuital specification that the platform has to assume
Keywords :
distortion measurement; field programmable gate arrays; harmonic distortion; measurement uncertainty; power supply quality; power system harmonics; power system measurement; FPGA platform; THD index meter; THD measurement; THD meter; Xilinx Virtex-II; field programmable gate array; measurement uncertainty; power network; power quality indexes; power quality monitoring; total harmonic distortion; uncertainty evaluation; Discrete Fourier transforms; Distortion measurement; Field programmable gate arrays; Instruments; Measurement standards; Measurement uncertainty; Power generation; Power measurement; Power quality; Total harmonic distortion; Analysis; Measurement Uncertainty; Power Quality; THD Measurement;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
Conference_Location :
Sorrento
Print_ISBN :
0-7803-9359-7
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2006.328686