DocumentCode
1885554
Title
The Histogram Test of ADCs is Unbiased by Phase Noise
Author
Alegria, F. Corrâa ; Serra, A. Cruz
Author_Institution
Inst. de Telecomunicacoes, Lisbon Tech. Univ., Lisboa
fYear
2006
fDate
24-27 April 2006
Firstpage
1639
Lastpage
1642
Abstract
It is shown here that the presence of phase noise or jitter in the test setup or in the ADC itself does not cause a bias in the transfer function estimation using the histogram test. The ADC parameters that are related to its transfer function are the transition voltages, code bin widths, integral non linearity, differential non linearity, gain and offset error
Keywords
analogue-digital conversion; circuit testing; phase noise; transfer functions; ADC parameters; analog-to-digital converter; code bin widths; differential nonlinearity; histogram test; integral nonlinearity; phase noise; transfer function; transition voltage; Analog-digital conversion; Clocks; Frequency; Histograms; Jitter; Phase noise; Sampling methods; Testing; Transfer functions; Voltage; Jitter; analog to digital converter; bias; histogram test; phase noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
Conference_Location
Sorrento
ISSN
1091-5281
Print_ISBN
0-7803-9359-7
Electronic_ISBN
1091-5281
Type
conf
DOI
10.1109/IMTC.2006.328186
Filename
4124624
Link To Document