• DocumentCode
    1885575
  • Title

    A new high temperature multilayer capacitor with acrylate dielectrics

  • Author

    Yializis, A. ; Powers, G.L. ; Shaw, D.G.

  • Author_Institution
    Spectrum Polytronics Inc., Tucson, AZ, USA
  • fYear
    1990
  • fDate
    20-23 May 1990
  • Firstpage
    169
  • Abstract
    A capacitor technology that makes use of vacuum-deposited electron-beam cross-linked acrylate materials has been developed. Polymer multilayer monolithic capacitors are produced by a continuous high-speed vacuum process. The polymer dielectric is formed by flash-evaporating an acrylate monomer material onto a rotating drum and then cross-linking it by electron-beam irradiation. The resulting polymer is thermally stable at temperatures in excess of 300°C. The dielectric films are pinhole-free, with stable electrical properties. The capacitor electrodes are vapor-deposited aluminium and are thin enough to allow the capacitor to self-heal. The number of layers typically varies between 1000 and 5000 and the dielectric thickness between 0.3 and 1.0 μm. The low dielectric thickness results in capacitor chips with high volumetric efficiency that can be surface mounted by conventional soldering techniques. An overview of the vacuum process, chip cutting, termination, packaging, electrical characteristics, and general test methodology is given here
  • Keywords
    capacitors; polymer films; surface mount technology; 0.3 to 1.0 micron; 300 C; Al electrodes; acrylate dielectrics; capacitor technology; chip cutting; continuous high-speed vacuum process; conventional soldering techniques; dielectric thickness; electrical characteristics; electron beam cross linking; flash evaporated acrylate monomer; high temperature multilayer capacitor; high volumetric efficiency; overview; packaging; pinhole-free; polymer multilayer monolithic capacitors; rotating drum; self-heal capacitors; stable electrical properties; surface mounted; termination; test methodology; vacuum process; vacuum-deposited electron-beam cross-linked acrylate materials; Aluminum; Capacitors; Dielectric films; Dielectric materials; Electrodes; Nonhomogeneous media; Polymers; Soldering; Temperature; Vacuum technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1990. ., 40th
  • Conference_Location
    Las Vegas, NV
  • Type

    conf

  • DOI
    10.1109/ECTC.1990.122201
  • Filename
    122201