DocumentCode :
1885765
Title :
Design of thermal interfaces with embedded microchannels to control bond line formation
Author :
Smith, Brian ; Rothuizen, Hugo ; Linderman, Ryan ; Brunschwiler, Thomas ; Michel, Bruno
Author_Institution :
Zurich Res. Lab., IBM Res., GmbH, Rueschlikon
fYear :
2008
fDate :
28-31 May 2008
Firstpage :
410
Lastpage :
418
Abstract :
Integrating microchannels at the thermal interfaces of heat sinks, spreaders, and microprocessor chips can reduce bond line thickness, assembly pressure, and overall thermal resistance. The channels help control the flow of particle-filled thermal interface materials (TIM) during the assembly squeeze but the relationship between channel geometry, material properties, and interfacial area is not fully understood. In the absence of meaningful analytical models, we develop a computational fluid dynamics approach to the non-Newtonian squeeze flow applied to rectangular 3D geometries. Experiments confirm the applicability of the models and illustrate the effect of viscoplasticity in highly loaded TIMs. Based on a first-principles thermal-fluidic model, the optimal width for a corner-to-corner channel is 608 mum for an 18times18 mm2 chip with 35 mum thick TIM bondline, or channel-to-chip size ratio of 0.068. Ongoing work will extend the technique to a general squeeze cell and multiple channel hierarchy levels for bond line optimization of high-performance thermal interface materials.
Keywords :
computational fluid dynamics; heat sinks; microassembling; microchannel flow; non-Newtonian flow; thermal management (packaging); thermal resistance; assembly pressure; bond line formation; bond line thickness; channel-to-chip size ratio; computational fluid dynamics; embedded microchannels; heat sinks; microchannels; microprocessor chips; nonNewtonian squeeze flow; rectangular 3D geometries; thermal interface materials; thermal resistance; Assembly; Bonding; Fluid flow control; Geometry; Heat sinks; Material properties; Microchannel; Microprocessor chips; Resistance heating; Thermal resistance; Bingham fluid; hierarchical nested channels; microchannel; squeeze flow; thermal interface; thermal interface material;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 2008. ITHERM 2008. 11th Intersociety Conference on
Conference_Location :
Orlando, FL
ISSN :
1087-9870
Print_ISBN :
978-1-4244-1700-1
Electronic_ISBN :
1087-9870
Type :
conf
DOI :
10.1109/ITHERM.2008.4544299
Filename :
4544299
Link To Document :
بازگشت