• DocumentCode
    1885830
  • Title

    Evaporated nanostructured Y2O3:Eu thin films

  • Author

    Hrudey, P.C.P. ; Taschuk, M. ; Tsui, Y.Y. ; Fedosejevs, R. ; Sit, J.C. ; Brett, M.J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Alberta, Edmonton, Canada
  • fYear
    2003
  • fDate
    20-23 July 2003
  • Firstpage
    327
  • Lastpage
    331
  • Abstract
    Europium-doped yttrium oxide (Y2O3:Eu) is a well-known luminescent material that has been experimented with in recent years in thin film form. However, to date there has not been a great effort put into altering the nanostructure of these films. A thin film deposition technique called glancing angle deposition (GLAD) allows for a high degree of control over the nanostructure of the thin film, resulting in thin films with nanostructures ranging from chevrons and posts to helices. GLAD was used here to make europium-doped yttrium oxide thin films with different nanostructures. Scanning electron microscopy was then used to characterize the nanostructures of the films, while UV excitation was used to characterize the photoluminescence properties of the films.
  • Keywords
    europium; nanostructured materials; photoluminescence; scanning electron microscopy; thin films; vacuum deposited coatings; yttrium compounds; UV excitation; Y2O3:Eu; Y2O3:Eu thin films; europium-doped yttrium oxide; evaporated nanostructure; glancing angle deposition; luminescent material; photoluminescence properties; scanning electron microscopy; Flat panel displays; Optical films; Phosphors; Powders; Rough surfaces; Sputtering; Substrates; Surface roughness; Transistors; Yttrium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    MEMS, NANO and Smart Systems, 2003. Proceedings. International Conference on
  • Print_ISBN
    0-7695-1947-4
  • Type

    conf

  • DOI
    10.1109/ICMENS.2003.1222019
  • Filename
    1222019