DocumentCode :
1885933
Title :
Spatial frequency domain heat transfer analysis of hot spot spreading in convectively cooled microprocessors
Author :
Etessam-Yazdani, Keivan ; Asheghi, Mehdi
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA
fYear :
2008
fDate :
28-31 May 2008
Firstpage :
456
Lastpage :
463
Abstract :
Spatial frequency domain (SFD) analyses of heat transfer along with the spatially-resolved imaging of microprocessor power (SIMP) method have provided a deeper understanding of the thermal behavior of microprocessors. In the present work, the thermal transfer function of a convectively cooled chip is written as a summation of functions with known Hankel transform pairs. Subsequently, the impulse response (obtained by deriving the inverse Hankel transform of the transfer function) is used to perform two-dimensional convolutions in the space domain. As expected, the thermal transfer function, which basically has the characteristics of a low pass filter, preserves the inputs with larger dimensions, whereas inputs with smaller sizes tend to expand. Interestingly enough, the expansion and spreading are not linearly related to the heat source size, and the system selectively spreads certain sizes more than others.
Keywords :
Hankel transforms; cooling; microprocessor chips; thermal analysis; 2D convolutions; convectively cooled microprocessors; hot spot spreading; impulse response; inverse Hankel transform; low pass filter; microprocessor power method; spatial frequency domain heat transfer analysis; spatially-resolved imaging; thermal behavior; thermal transfer function; Cooling; Equations; Frequency domain analysis; Heat engines; Heat transfer; Image analysis; Microprocessors; Thermal expansion; Thermal resistance; Transfer functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 2008. ITHERM 2008. 11th Intersociety Conference on
Conference_Location :
Orlando, FL
ISSN :
1087-9870
Print_ISBN :
978-1-4244-1700-1
Electronic_ISBN :
1087-9870
Type :
conf
DOI :
10.1109/ITHERM.2008.4544305
Filename :
4544305
Link To Document :
بازگشت