Title :
Macromodeling of IC output buffers from in-place measurements
Author :
Stievano, I.S. ; Maio, I.A. ; Canavero, F.G.
Author_Institution :
Dipt. di Elettronica, Politecnico di Torino
Abstract :
This paper addresses the development of accurate and efficient macromodels of the output ports of digital integrated circuits. The proposed approach is based on the estimation of mathematical parametric relations reproducing the external behavior of devices from transient port voltage and current responses recorded during the normal activity of the IC. The efficiency of the approach is demonstrated on a real device via numerical simulation, also for model estimation based on noisy measurements
Keywords :
digital integrated circuits; integrated circuit measurement; integrated circuit modelling; transient response; digital IC ports; digital integrated circuits; integrated circuit macromodeling; noisy measurements; transient port current response; transient port voltage response; Digital integrated circuits; Fixtures; Instrumentation and measurement; Integrated circuit modeling; Logic devices; Mathematical model; Numerical simulation; Parametric statistics; Testing; Voltage; Behavioral models; Digital IC ports; Identification; Macromodels;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
Conference_Location :
Sorrento
Print_ISBN :
0-7803-9359-7
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2006.328220
