Title :
Improving cycle time through managing variability in a DRAM production line
Author :
Majorana, A. ; Iuliano, Guglielmo
Author_Institution :
Texas Instrum., Avezzano, Italy
Abstract :
The authors describe the process adopted to improve productivity in terms of cycle time decrease in a DRAM wafer fab (AMOS, Texas Instruments Italy). In order to arrange the structural and managerial factors influencing the cycle time of products, an integrated approach aimed to contain the variability is outlined. Such a process generated a 30% cycle time reduction in 1996 with a remarkable impact on the operating performance of the factory
Keywords :
DRAM chips; integrated circuit manufacture; production control; DRAM production line; cycle time improvement; factory operating performance; productivity improvement; variability management; Equations; Instruments; Manufacturing; Production facilities; Productivity; Random access memory; Semiconductor device manufacture; Steady-state; Testing; Throughput;
Conference_Titel :
Semiconductor Manufacturing Conference Proceedings, 1997 IEEE International Symposium on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-3752-2
DOI :
10.1109/ISSM.1997.664487
