Title :
Instrumentation Design for Gate and Drain Low Frequency Noise Measurements
Author :
Giusi, G. ; Crupi, F. ; Ciofi, C. ; Pace, C.
Author_Institution :
Messina Univ.
Abstract :
In this paper we present an on-wafer measurement system suited for the characterization of low frequency current noise in CMOS devices. Guidelines for designing the preamplifier and the bias stage at the drain and gate terminals are discussed. A simple implementation of the proposed design approach is reported. The system capability is tested through 1/f noise measurements in advanced CMOS devices
Keywords :
1/f noise; CMOS integrated circuits; electric noise measurement; integrated circuit measurement; integrated circuit noise; 1/f noise; CMOS devices; drain noise; gate noise; low frequency current noise; low frequency noise measurements; low noise amplifiers; on-wafer measurement system; preamplifier design; Circuit noise; Current measurement; Frequency measurement; Instruments; Low-frequency noise; MOSFET circuits; Noise generators; Noise level; Noise measurement; Voltage; CMOS devices; Low noise amplifiers; drain noise; gate noise; low frequency noise;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
Conference_Location :
Sorrento
Print_ISBN :
0-7803-9359-7
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2006.328224
