DocumentCode :
1886502
Title :
Strain-rate-dependant mechanical properties for Sn-3.8Ag-0.7Cu and SAC-X solder alloy
Author :
Xu, Luhua ; Tan, Kok Ee ; Pang, John H L
Author_Institution :
Sch. of Mech. & Aerosp. Eng., Nanyang Technol. Univ., Singapore
fYear :
2008
fDate :
28-31 May 2008
Firstpage :
632
Lastpage :
637
Abstract :
The mechanical properties of electronic solder materials are highly dependent on test temperature and strain rate. In this paper strain rate dependent elastic modulus and yield strength of Sn-3.8Ag-0.7Cu and Sn-Ag-Cu-X (SAC-X) where, X is a small addition of a fourth element. Nano-indentation tests were conducted from slow to intermediate strain rates, (10-3 ~101) by using the continuous stiffness measurement (CSM) technique. The strain-rate-dependent yield stress is curve fitted to a power law relationship with strain rate. For all the tests conducted, the higher the strain rate the higher the elastic modulus and yield stress of the solder; the higher the temperature the lower the elastic modulus and yield stress.
Keywords :
copper alloys; elastic moduli; indentation; silver alloys; soldering; solders; tin alloys; yield stress; Sn-Ag-Cu; continuous stiffness measurement technique; dependent elastic modulus; elastic modulus; electronic solder materials; intermediate strain rates; nanoindentation tests; solder alloy; strain-rate-dependant mechanical properties; strain-rate-dependent yield stress; Capacitive sensors; Creep; Mechanical factors; Soldering; Strain measurement; Stress measurement; Temperature; Tensile strain; Tensile stress; Testing; continuous stiffness measurement; drop impact; nano-indentation; solder; strain-rate;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 2008. ITHERM 2008. 11th Intersociety Conference on
Conference_Location :
Orlando, FL
ISSN :
1087-9870
Print_ISBN :
978-1-4244-1700-1
Electronic_ISBN :
1087-9870
Type :
conf
DOI :
10.1109/ITHERM.2008.4544328
Filename :
4544328
Link To Document :
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