• DocumentCode
    1886641
  • Title

    Development of ultra-thin surface mounting IC package (0.8 mm thick TQFP)

  • Author

    Fujita, Kazuya ; Oomi, Susumu ; Toyozawa, Kenji ; Minamide, Syozo ; Maeda, Takamichi

  • Author_Institution
    Sharp Corp., Nara, Japan
  • fYear
    1990
  • fDate
    20-23 May 1990
  • Firstpage
    302
  • Abstract
    A TQFP (thin quad flat package) with a package size of 10×10 mm and a maximum package thickness of 0.8 mm has been developed to meet the need for lower profiles in surface-mounting packages. For a package thickness of 1.0 mm, the conventional lead-frame thickness and chip thickness are sufficient. However, when the package thickness is reduced to 0.8 mm, a reduction in at least one of the conventional thicknesses is absolutely essential. Therefore, by reducing the thickness of only part of the die-pad portion of the lead frame through the use of chemical etching to approximately 1/2 to 2/3, the resin thickness above the chip and below the die pad is ensured. A low-loop wire bond with a maximum of 0.14 mm was achieved by optimizing the wire material and wire-bond conditions. Ultrathin molding was achieved by improving the fluid characteristics of the resin and by ensuring the resin-fluid balance within the cavity. Package cracking and degraded moisture resistance were evaluated using a 4-Mbit mask ROM. After subjecting it to 85°C and 75% RH for 72 h, no problems were noticed while soldering at 240°C maximum with infrared reflow
  • Keywords
    VLSI; integrated memory circuits; lead bonding; packaging; read-only storage; surface mount technology; 0.8 mm; 10 mm; 240 C; 4 Mbit; 4-Mbit mask ROM; 72 h; 85 C; PQFP; TQFP; ULSI; degraded moisture resistance; die-pad; low-loop wire bond; lower profiles; package size; package thickness; resin-fluid balance; soldering; surface-mounting packages; thin QFP; thin quad flat package; ultra-thin surface mounting IC package; wire-bond conditions; Bonding; Chemicals; Degradation; Etching; Integrated circuit packaging; Lead; Moisture; Read only memory; Resins; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1990. ., 40th
  • Conference_Location
    Las Vegas, NV
  • Type

    conf

  • DOI
    10.1109/ECTC.1990.122206
  • Filename
    122206