DocumentCode :
1886984
Title :
Monte Carlo simulation and experimental study of an electron cyclotron resonance plasma for thin film deposition
Author :
Koretzky, E. ; Kuo, S.P. ; Kuo, S.C.
Author_Institution :
Polytech. Univ., Farmingdale, NY, USA
fYear :
1997
fDate :
19-22 May 1997
Firstpage :
231
Abstract :
Summary form only given. Monte Carlo simulation of electron behavior in an ECR microwave discharge, maintained by the TM/sub 11/ mode of a cylindrical waveguide, has been performed. The results show that at low pressures (/spl sim/0.5 mtorr) the temperature of the tail portion of the EED exceeds 40 eV and the sheath potential is about -200 V. These results are about twice as high as the previous using the TM/sub 01/ mode. An ECR plasma source has been designed accordingly. A Langmuir probe is used to measure the characteristics of the plasma. Hydrogen mixed with 1% methane at a pressure of 0.5 mtorr is used as the background gas. The simulation and experimental results will be presented.
Keywords :
Langmuir probes; Monte Carlo methods; circular waveguides; high-frequency discharges; plasma deposition; plasma temperature; thin films; -200 V; 0.5 mtorr; ECR microwave discharge; H/sub 2/-methane mixture; Langmuir probe; Monte Carlo simulation; TM/sub 11/ mode; cylindrical waveguide; electron behavior; electron cyclotron resonance plasma; sheath potential; temperature; thin film deposition; Electrons; Hydrogen; Plasma measurements; Plasma properties; Plasma sheaths; Plasma simulation; Plasma sources; Plasma temperature; Probes; Tail;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1997. IEEE Conference Record - Abstracts., 1997 IEEE International Conference on
Conference_Location :
San Diego, CA, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-3990-8
Type :
conf
DOI :
10.1109/PLASMA.1997.604953
Filename :
604953
Link To Document :
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