Title :
Dependency of backscattering from ocean surface on wind direction by using airborne SAR - low wind speed case
Author :
Nadai, Akitsugu ; Umehara, T. ; Matsuoka, T. ; Take, M. Sa ; Kobayashi, T. ; Uratsuka, S.
Author_Institution :
Nat. Inst. of Inf. & Commun. Technol., Tokyo, Japan
Abstract :
The dependency of backscattering from ocean surface on wind direction under low wind speed (5m/s) is analyzed using observation data by an airborne dual-frequency SAR in the Land X-bands. The NRCS difference between up- and down-wind conditions depends on the incidence angle in the X-band HH polarization, though that in the VV polarization, the NRCS difference is almost zero. Moreover, the NRCS difference between parallel- and cross-wind conditions in the VV polarization is greater than that in the HH polarization. Though the dependency of the NRCS in the L-band on the wind direction is smaller than that in the X-band, the NRCSs in the L-band cross polarizations under the cross-wind condition is greater than that under the parallel-wind condition. The polarization ratio (PR) difference between up- and down-wind directions depends on the incidence angle as the incidence angle dependency in the X-band HH polarization. The dependency of the PR in the L-band on wind direction is also weaker than that in the X-band. The results suggest the possibility of ocean wind measurement using the polarimetric SAR in the X-band and/or using the dual-frequency SAR.
Keywords :
ocean waves; remote sensing by radar; synthetic aperture radar; wind; L-band; VV polarization; X-band; X-band HH polarization; airborne dual-frequency SAR; cross-wind condition; down-wind condition; dual-frequency SAR; low wind speed; ocean surface; ocean wind measurement; parallel-wind condition; polarimetric SAR; polarization ratio; up-wind condition; wind direction; Azimuth; Indexes; Sea surface; normalized radar cross section; ocean winds; polarization ratio; synthetic aperture radar;
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2011 IEEE International
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4577-1003-2
DOI :
10.1109/IGARSS.2011.6049535