DocumentCode
1887164
Title
Aging-informed behavior of Sn3.8Ag0.7Cu solder alloys
Author
Mysore, K. ; Chan, D. ; Bhate, D. ; Subbarayan, G. ; Dutta, I. ; Gupta, V. ; Zhao, J. ; Edwards, D.
Author_Institution
Purdue Univ., West Lafayette, IN
fYear
2008
fDate
28-31 May 2008
Firstpage
870
Lastpage
875
Abstract
Predicting reliability of solder joints requires a thorough understanding of solder constitutive behavior. Recent studies on SnAgCu solder alloys have reported that pre-test conditions of aging-time and aging-temperatures can be factors that significantly affect solder constitutive behavior. The results presented here are a part of ongoing efforts to construct constitutive models that can predict aging affects on behavior of SnAgCu solder alloys. In this work, creep test results on aged Sn3.8Ag0.7Cu samples are reported, and aging effects are discussed primarily on secondary creep behavior and on microstructure. Aging effects on primary creep are observed, and will be discussed, and modeled in a future work. Experiments to characterize behavior were carried out using double-lap shear tests on specimens specifically prepared to represent realistic microstructures, and mitigate effects of joint geometry, and stress heterogeneity during test conditions. Aging temperatures of -10deg C, 25deg C, 75deg C and 125deg C, and aging times of 15, 30, 60 and 90 days (at each aging temperature) were selected as different levels of factors in a statistically designed experiment. Previous studies have focused on developing constitutive models without due considerations to aging effects, the results presented herein augment aging-informed constitutive model development efforts that are currently in progress.
Keywords
ageing; copper alloys; creep testing; reliability; silver alloys; solders; tin alloys; SnAgCu; aging-informed behavior; aging-temperature; double-lap shear test; microstructure; reliability prediction; secondary creep behavior; solder alloy; temperature -10 C; temperature 125 C; temperature 25 C; temperature 75 C; Aging; Capacitive sensors; Creep; Lead; Material properties; Materials testing; Microstructure; Soldering; Stress; Temperature distribution; Anand model; aging; lead-free solders; primary creep;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems, 2008. ITHERM 2008. 11th Intersociety Conference on
Conference_Location
Orlando, FL
ISSN
1087-9870
Print_ISBN
978-1-4244-1700-1
Electronic_ISBN
1087-9870
Type
conf
DOI
10.1109/ITHERM.2008.4544357
Filename
4544357
Link To Document