Title :
High Accuracy Disbond Thickness Estimation Scheme Employing Multiple-Frequency Near-Field Microwave Measurements
Author :
Abou-Khousa, M.A. ; Zoughi, R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Missouri Univ., Rolla, MO
Abstract :
Microwave nondestructive evaluation (NDE) techniques have shown great potential for disbond detection in multi-layer dielectric structures. However, a quantitative disbond thickness estimation scheme has not been introduced yet. In this paper, we propose a maximum-likelihood (ML) disbond thickness estimation scheme utilizing multiple independent measurements obtained at different frequencies. By simulations and experiments, we show that the proposed scheme produces highly accurate disbond thickness estimates
Keywords :
maximum likelihood estimation; microwave measurement; nondestructive testing; disbond thickness estimation; maximum likelihood estimation; multiple frequency near field microwave measurements; nondestructive evaluation; Dielectric substrates; Frequency estimation; Frequency measurement; Maximum likelihood detection; Maximum likelihood estimation; Microwave measurements; Microwave theory and techniques; Rectangular waveguides; Reflection; Thickness measurement; Disbond thickness; maximum likelihood (ML); multiple frequency measurements; nondestructive evaluation (NDE;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
Conference_Location :
Sorrento
Print_ISBN :
0-7803-9359-7
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2006.328387