• DocumentCode
    1887313
  • Title

    Using commercial modeling and simulation tools within NGTG processes

  • Author

    Lynch, Michael L.

  • Author_Institution
    Naval Undersea Warfare Center, Newport, RI, USA
  • fYear
    1997
  • fDate
    22-25 Sep 1997
  • Firstpage
    121
  • Lastpage
    125
  • Abstract
    Next Generation Test Generator (NGTG) processes require the existence of circuit models, both good and faulty, as well as the simulation of these models in order to develop tests in an effective manner. This paper addresses the issues associated with model development and simulation within an NGTG framework. The emphasis of the model development and simulation methods is on the use of commercial tools. If test automation processes are to be successfully used throughout the design and test community, the tools that designers are familiar with and use everyday must be incorporated into the NGTG processes. This paper describes the overall system briefly and the functional elements related to model development in detail. The model development portion of the system is composed of three basic functional elements: Netlist Generator (NG), Component Model Library (CML) and Automatic Model Builder (AMB). The simulation of the models is an integral part of the Automatic Test Generation (ATG) system and is presented in detail. A circuit model development process is described which allows for the creation of the good circuit model as well as the fault models necessary as part of the ATG systems. The model development and simulation approach emphasizes the use of commercial tools such as OrCAD(R)´s CaptureTM, Simucad´s SILOS(R) III and IntusoftTM´s ICAP/4
  • Keywords
    automatic test software; circuit testing; digital simulation; fault location; software tools; ATG; Automatic Test Generation; Capture; ICAP; Intusoft; NGTG processes; OrCAD; SILOS; Simucad; automation processes; circuit model; circuit model development; circuit model development process; commercial modeling; fault models; model development; simulation; simulation tools; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Design engineering; Hardware design languages; Libraries; Neural networks; SPICE; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    0-7803-4162-7
  • Type

    conf

  • DOI
    10.1109/AUTEST.1997.633584
  • Filename
    633584