DocumentCode
1887316
Title
A review of non-hermetic optoelectronic packaging
Author
Madduri, Sushma ; Sammakia, Bahgat G. ; Infantolino, Bill ; Chaparala, Satish
Author_Institution
IEEC, State Univ. of New York, Binghamton, NY
fYear
2008
fDate
28-31 May 2008
Firstpage
913
Lastpage
919
Abstract
This paper is a summary of a literature survey done on non-hermetic optoelectronic packages focusing on the cost and reliability aspects. The development of reliable non-hermetic lasers would not only lead to the elimination of the costs specifically associated with hermetic packaging but also lead the way for possible revolutionary low-cost optoelectronic packaging technologies. The paper starts with an introduction to the concept of hermeticity in optoelectronic packages, followed by a detailed review of the reliability issues and failure mechanisms observed in non-hermetic packages when compared to their hermetic counter parts. A hermetic seal in electronic packages is used to prevent the entry of air, foreign gases, contaminants, and most importantly moisture. To seal a package hermetically is particularly challenging and expensive. There are various techniques that have been investigated, to improve the reliability of non-hermetic packages. A few are discussed here such as facet passivation type, choosing a better optical glass and encapsulation techniques. Also accelerated testing is discussed. Some of the most common and important failure mechanisms like popcorn failure, adhesive degradation, laser misalignment and epoxy swelling are discussed.
Keywords
electronics packaging; hermetic seals; optoelectronic devices; reliability; accelerated testing; encapsulation technique; failure mechanism; hermetic seal; nonhermetic laser; nonhermetic optoelectronic package; nonhermetic optoelectronic packaging; optoelectronic package hermeticity; reliability; Costs; Counting circuits; Electronics packaging; Encapsulation; Failure analysis; Gases; Glass; Hermetic seals; Moisture; Passivation;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems, 2008. ITHERM 2008. 11th Intersociety Conference on
Conference_Location
Orlando, FL
ISSN
1087-9870
Print_ISBN
978-1-4244-1700-1
Electronic_ISBN
1087-9870
Type
conf
DOI
10.1109/ITHERM.2008.4544364
Filename
4544364
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