• DocumentCode
    1887316
  • Title

    A review of non-hermetic optoelectronic packaging

  • Author

    Madduri, Sushma ; Sammakia, Bahgat G. ; Infantolino, Bill ; Chaparala, Satish

  • Author_Institution
    IEEC, State Univ. of New York, Binghamton, NY
  • fYear
    2008
  • fDate
    28-31 May 2008
  • Firstpage
    913
  • Lastpage
    919
  • Abstract
    This paper is a summary of a literature survey done on non-hermetic optoelectronic packages focusing on the cost and reliability aspects. The development of reliable non-hermetic lasers would not only lead to the elimination of the costs specifically associated with hermetic packaging but also lead the way for possible revolutionary low-cost optoelectronic packaging technologies. The paper starts with an introduction to the concept of hermeticity in optoelectronic packages, followed by a detailed review of the reliability issues and failure mechanisms observed in non-hermetic packages when compared to their hermetic counter parts. A hermetic seal in electronic packages is used to prevent the entry of air, foreign gases, contaminants, and most importantly moisture. To seal a package hermetically is particularly challenging and expensive. There are various techniques that have been investigated, to improve the reliability of non-hermetic packages. A few are discussed here such as facet passivation type, choosing a better optical glass and encapsulation techniques. Also accelerated testing is discussed. Some of the most common and important failure mechanisms like popcorn failure, adhesive degradation, laser misalignment and epoxy swelling are discussed.
  • Keywords
    electronics packaging; hermetic seals; optoelectronic devices; reliability; accelerated testing; encapsulation technique; failure mechanism; hermetic seal; nonhermetic laser; nonhermetic optoelectronic package; nonhermetic optoelectronic packaging; optoelectronic package hermeticity; reliability; Costs; Counting circuits; Electronics packaging; Encapsulation; Failure analysis; Gases; Glass; Hermetic seals; Moisture; Passivation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems, 2008. ITHERM 2008. 11th Intersociety Conference on
  • Conference_Location
    Orlando, FL
  • ISSN
    1087-9870
  • Print_ISBN
    978-1-4244-1700-1
  • Electronic_ISBN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2008.4544364
  • Filename
    4544364