DocumentCode :
18874
Title :
Investigating a MOSFET Driver (Buffer) Circuit Transition Ringings Using an Analytical Model
Author :
Azizoglu, Buket Turan ; Karaca, Haldun
Author_Institution :
Dept. of Electr. & Electron. Eng., Dokuz Eylul Univ., Izmir, Turkey
Volume :
30
Issue :
9
fYear :
2015
fDate :
Sept. 2015
Firstpage :
5058
Lastpage :
5066
Abstract :
In this paper, a new analytical model introduced extracting from datasheet of a MOSFET and developed a MATLAB code for simulating a MOSFET driver circuit is proposed in the literature to observe the ringings of its output for capacitively loaded case. The output waveform is studied only for high-to-low transition. Gate drive resistance, wiring parasitics of the printed circuit board layout, and the characteristic properties of the MOSFET affect both the delay time of the MOSFET to become ON and performance of the driver circuit. Also, voltage stress of the MOSFET and therefore safe operating range for the circuit all depend on these effects. These effects are all considered in the design stage. The simulation results obtained from CST Design Studio software are compared with the results of experimental work. The analytical modeling results solved in the MATLAB are found congruent with the simulation results and experimental results as well. The simulation work showed that developed MATLAB code along with extracted models from datasheets has less convergence problems and also requires less simulation time.
Keywords :
MOSFET; buffer circuits; driver circuits; printed circuit layout; CST design studio software; MATLAB code; MOSFET driver circuit transition ringings; PCB layout; analytical modeling; buffer circuit; capacitively loaded case; characteristic properties; delay time; design stage; gate drive resistance; high-to-low transition; printed circuit board layout; wiring parasitics; Analytical models; Capacitance; Inductance; Integrated circuit modeling; Logic gates; MOSFET; Resistance; CMOS Buffer Circuit; CMOS buffer circuit; MOSFET modeling; gate drive resistance; gate drive resistance,MOSFET modeling;
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/TPEL.2014.2366431
Filename :
6940242
Link To Document :
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