Title : 
Application of wavelet for improvement of rate-reach performance in ADSL interference environment
         
        
            Author : 
Ravishankar, S. ; Uma, B.V. ; Shreeprasad, M.
         
        
            Author_Institution : 
R.V. Coll. of Eng, Bangalore
         
        
        
        
        
        
            Abstract : 
This paper discusses the cancellation of near end crosstalk (NEXT) and far end crosstalk (FEXT) using a non-parametric wavelet denoising technique. Crosstalk noise is estimated using heuristic Steinpsilas unbiased risk estimate (SURE) and Bayesian risk minimization threshold function. The noise level estimated by a threshold function is used by thresholding rules to mitigate the effect of noise in the signal. A comparison of rates achieved with three thresholding techniques viz; soft thresholds, hard thresholds and a garrote threshold have been presented. Results obtained with AWGN, 24 ADSL NEXT and 24 ADSL FEXT disturbers show a significant improvement in rate reach performance upwards of 4 Mbps. The computational complexity in the wavelet denoising technique is independent of the number of crosstalk sources and hence can be suitable candidate for a practical deployment of mitigation of cross talk.
         
        
            Keywords : 
AWGN; Bayes methods; crosstalk; digital subscriber lines; interference suppression; risk analysis; signal denoising; wavelet transforms; ADSL interference; AWGN; Bayesian risk minimization threshold function; SURE; asymmetric digital subscriber line; computational complexity; far end crosstalk cancellation; heuristic Stein unbiased risk estimation; near end crosstalk cancellation; noise estimation; nonparametric wavelet denoising technique; AWGN; Additive white noise; Bayesian methods; Computational complexity; Crosstalk; Gaussian noise; Interference; Noise level; Noise reduction; Risk management; Crosstalk; Denoising; Threshold; Wavelet;
         
        
        
        
            Conference_Titel : 
Communication Technology, 2008. ICCT 2008. 11th IEEE International Conference on
         
        
            Conference_Location : 
Hangzhou
         
        
            Print_ISBN : 
978-1-4244-2250-0
         
        
            Electronic_ISBN : 
978-1-4244-2251-7
         
        
        
            DOI : 
10.1109/ICCT.2008.4716124