Title :
How to identify the image potential in field emission from non-metallic emitters?
Author_Institution :
State Key Lab. of Optoelectron. Mater. & Technol., Sun Yat-Sen Univ., Guangzhou, China
Abstract :
We study comparatively Fowler-Nordheim (FN) and Schottky-Nordheim (SN) models to give a criterion to identify the image potential effect in the field emission from non-metallic emitters, which can be applied to distinct the metallic and non-metallic properties of the field emission from the experimental data.
Keywords :
electron field emission; Fowler-Nordheim models; Schottky-Nordheim models; field emission; image potential; nonmetallic emitters; Analytical models; Data models; Electric fields; Electric potential; Nanoelectronics; Tin; Vacuum technology; Fowler-Nordheim (FN) and Schottky-Nordheim (SN) models; image potential;
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2015 28th International
Conference_Location :
Guangzhou
Print_ISBN :
978-1-4673-9356-0
DOI :
10.1109/IVNC.2015.7225529
