• DocumentCode
    1887755
  • Title

    An engineering ansatz for rescuing “waste-bin” field emission results

  • Author

    Forbes, Richard G.

  • Author_Institution
    Dept. of Electron. Eng., Univ. of Surrey, Guildford, UK
  • fYear
    2015
  • fDate
    13-17 July 2015
  • Firstpage
    68
  • Lastpage
    69
  • Abstract
    This conference poster presents an engineering ansatz that may be useful in situations where an orthodoxy test on the related Fowler-Nordheim plot has suggested that an extracted apparent field enhancement factor (FEF) βapp is spuriously large. The ansatz, called phenomenological adjustment, converts βapp to a smaller “ansatz-corrected” value βazc that can be presumed to be closer to the true macroscopic FEF (γC) value.
  • Keywords
    electron field emission; Fowler-Nordheim plot; engineering ansatz; macroscopic field enhancement factor; orthodoxy test; phenomenological adjustment; waste-bin field emission; Electron emission; Nanoelectronics; Resistance; System-on-chip; Tin; Vacuum technology; Voltage measurement; Field electron emission; Fowler-Nordheim plot analysis; field enhancement factor; phenomenological adjustment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference (IVNC), 2015 28th International
  • Conference_Location
    Guangzhou
  • Print_ISBN
    978-1-4673-9356-0
  • Type

    conf

  • DOI
    10.1109/IVNC.2015.7225535
  • Filename
    7225535
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1887755